F16-Metrology Application Engineer
Core
Develop, analyze, and implement metrology measurement techniques (lithography overlay, CD-SEM, ellipsometry, scatterometry, XRF, surface profiling) to support semiconductor manufacturing process setup, improvement, and optimization.
Role type
Senior IC metrology application engineer (semiconductor fab)
Builds
Metrology applications and measurement capabilities for DRAM, NAND, and NOR memory and storage products
Domain
Semiconductor manufacturing / Memory and storage
Required skills
Lithography overlay analysis, CD-SEM operation, ellipsometry, scatterometry, XRF, surface profiling, process characterization, NPI transfer support, supplier tool CIP management, data-driven problem solving
Preferred skills
AI-enabled workflow implementation, automation, data analytics
Technologies
CD-SEM, Ellipsometry, Scatterometry, XRF, SWR systems
Responsibilities
Develop and implement metrology techniques for lithography overlay and CD-SEM; Perform SWR lots for new process equipment setup and optimization; Lead supplier tool CIP and NPI transfer activities; Analyze next-generation measurement capabilities and coordinate evolutionary programs; Standardize knowledge and ways of working for the metrology team; Engage with TD and MCT for new tech introduction; Leverage AI and automation to improve operational efficiency
Seniority
Senior, hands-on IC