OMT Metrology Application Engineer
Core
Develop, analyze, and implement metrology measurement techniques in Photo Lithography or Film Metrology to support New Product Introduction (NPI) transfer and process reliability in semiconductor manufacturing.
Role type
Senior IC metrology application engineer (semiconductor)
Builds
Metrology recipes, measurement techniques, and process validation for advanced semiconductor nodes
Domain
Semiconductor manufacturing / Photo Lithography / Film Metrology
Required skills
Metrology measurement techniques, Overlay model and NZO correction, CD-SEM, OCD scatterometry, X-ray and surface analysis, NPI transfer, SWR and conversion planning, Model-based problem solving (MBPS), Root cause investigation, Data correlation, Analytical deep dive
Preferred skills
Data science and data mining (Python, JMP, SQL, Y3), Vendor engagement, Cross-functional teamwork, Project management
Technologies
CD-SEM, OCD scatterometry, X-ray, Laser, Optical Systems, Python, JMP, SQL, Y3
Responsibilities
Develop and implement metrology measurement techniques in Photo Lithography or Film Metrology; Perform SWR and conversion plan to validate Metrology recipe setup; Be responsible for NPI transfer, defining quality metrics, and driving cross-site matching performance; Collaborate with fab operation and equipment teams to improve quality, cost, capacity, and cycle time; Drive understanding of new metrology technology to meet technical roadmap; Evaluate continuous improvement program through vendor engagement; Engage with the global network to develop best-known methods.