OMT Metrology Application Engineer
Core
Develop, analyze, and implement metrology measurement techniques in Photo Lithography or Film Metrology to support semiconductor process development and technology transfer.
Role type
Senior IC metrology application engineer (semiconductor)
Builds
Metrology recipes, measurement techniques, and process validation for new product introduction (NPI) in semiconductor manufacturing.
Domain
Semiconductor manufacturing / Photo Lithography / Film Metrology
Deliverable
production ML models | product features | dashboards & analysis | research | client delivery | infrastructure | physical/clinical work
Required skills
Metrology measurement techniques, lithography overlay modeling, root cause investigation, data correlation, analytical deep dive, project management, cross-functional collaboration
Preferred skills
Data science and data mining, Python, JMP, SQL, Y3, coding, programming, model-based problem solving (MBPS), vendor engagement
Technologies
CD-SEM, OCD scatterometry, X-ray, surface analysis platforms, SWR, NZO correction
Responsibilities
Develop and implement metrology measurement techniques, perform special work requests for recipe validation, drive cross-site matching performance, collaborate with fab operations to improve quality and capacity, evaluate continuous improvement programs, engage with global network for best-known methods
Seniority
Mid-level, hands-on IC