F11 Metrology Application Engineer
Core
Develop, analyze, and implement metrology measurement techniques (lithography overlay, CD-SEM, ellipsometry, scatterometry, XRF, surface profiling) to support semiconductor manufacturing process setup, improvement, and optimization.
Role type
Senior IC metrology application engineer (semiconductor)
Builds
Metrology applications and measurement capabilities for DRAM, NAND, and NOR memory and storage products
Domain
Semiconductor manufacturing / Memory and storage
Required skills
Lithography overlay measurement, CD-SEM operation, Ellipsometry, Scatterometry, XRF, Surface profiling, Process optimization, NPI transfer, Supplier tool CIP, Quality metrics definition, AI-enabled problem solving, Data-driven insights
Preferred skills
AI tool integration, Automation, Digital fluency, AI literacy
Technologies
CD-SEM, Ellipsometry, Scatterometry, XRF, AI tools
Responsibilities
Develop and implement metrology techniques for films; Perform SWR lots for new process equipment setup; Drive supplier tool CIP and NPI transfer activities; Engage in Fab operations to improve quality, reduce cost, and improve yield; Deliver reliable metrology applications and standardize team knowledge; Integrate AI-assisted tools to improve efficiency and decision-making
Seniority
Senior, hands-on IC