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Senior Test Engineer

United States, Oregon, Hillsboro💼 Full-time🗓 2026-07-15 → 2026-09-26

Core

Develop and execute scan (structural) test programs for semiconductor ICs, supporting silicon bring-up, validation, and manufacturing readiness across fabrication, test, and packaging phases.

Role type

Senior IC Test Engineer (Scan/Structural Test)

Builds

ATE test programs, scan patterns, and test methodologies for logic defects

Domain

Semiconductor / Integrated Circuit Design

Deliverable

production ML models | product features | dashboards & analysis | research | client delivery | infrastructure | physical/clinical work

Required skills

Scan architecture, ATPG, fault models, silicon fabrication processes, product qualification, reliability, transistor theory, DFT features (SAF/TDF, JTAG, boundary scan, at-speed testing), scan diagnosis tools, failure analysis, yield improvement, simulation, emulation, pattern verification, Linux environments, unit and integration testing, probability, statistics, DOE concepts, computer architecture fundamentals

Preferred skills

Mixed-signal IP test development, device physics background, high-performance computing, AI, GPUs, telecom domains

Technologies

Advantest 93K, Linux

Responsibilities

Contribute to silicon bring-up, validation, and manufacturing readiness; Execute defined test plans and methodologies; Identify issues and escalate risks with technical data; Collaborate with design, DFT, product, and manufacturing teams; Support scan test content generation, pattern validation, and post-silicon debug; Perform failure analysis using scan diagnosis tools to support yield improvement

Seniority

Senior, hands-on IC development and test engineering

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