MTS, OMT Metrology
Core
Develop and optimize metrology methods to enhance yield, quality, and cost efficiency for memory and storage manufacturing processes.
Role type
Senior IC metrology engineer (semiconductor manufacturing)
Builds
Inline detection and control systems for DRAM, NAND, and NOR memory production
Domain
Semiconductor manufacturing / Metrology
Deliverable
production ML models | product features | dashboards & analysis | research | client delivery | infrastructure | physical/clinical work
Required skills
Metrology method development, yield improvement strategy, process condition optimization, equipment evaluation, cross-functional resource management, technical leadership, problem-solving analysis, global team coordination, business process optimization, supplier engagement, performance metric analysis
Preferred skills
Experience with RAM detection performance, knowledge of Best Known Methods (BKM), familiarity with HVM/TD collaboration, patent generation, cross-site alignment
Technologies
Metrology equipment, IV/IC systems, H2H/TOR evaluation processes, Fab performance metrics tools
Responsibilities
Establish and optimize process conditions and technologies to enhance capability and reduce cost; Drive process management projects and introduce new technologies and Best Known Methods (BKM); Continuously lead detection strategies (IV/IC), systems, and methods to enhance detection performance; Lead problem-solving analysis and corrective actions in top-level task force; Provide technical leadership and strategic direction to the team and cross-functional partners; Track and analyze Fab performance metrics for benchmarking and improvement
Seniority
Senior, hands-on IC with strategic direction
