Focused Ion Beam (FIB) Technician IV
Core
Prepare high-quality samples for semiconductor failure analysis and process development using Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), and Transmission Electron Microscopy (TEM) techniques.
Role type
Senior IC materials science technician (FIB/SEM/TEM)
Builds
High-quality cross-section samples, TEM lamella, and analytical data for engineering investigations
Domain
Semiconductor manufacturing and failure analysis
Required skills
FIB sample preparation, TEM lamella preparation, SEM operation, metrology tool operation, cross-sectional imaging, critical dimension (CD) measurement, energy dispersive spectroscopy (EDS) analysis, equipment maintenance, troubleshooting, data record management
Preferred skills
Materials Science or Engineering Technology background, experience in semiconductor production or failure analysis labs
Technologies
FIB, SEM, TEM, metrology systems, Microsoft Office
Responsibilities
Prepare samples for experimentation including cleaning, mounting, and loading FOUPs; Prepare TEM lamella samples using FIB techniques; Identify locations of interest based on engineering drawings; Operate SEM, FIB, TEM, and laboratory metrology tools; Perform cross-sectional and plan-view imaging, CD measurements, and EDS analysis; Operate and maintain SEM, FIB, TEM, and related metrology systems; Perform routine maintenance activities including plasma cleaning and system checks; Interface with customers, engineers, and requestors to understand requirements and communicate results; Monitor job queues and support laboratory throughput objectives; Verify, upload, and maintain data records on network storage systems.