Senior/Engineer, Metrology Process Development
Core
Lead R&D, operation, and sustainment of advanced CDSEM metrology, AFM, overlay/registration, X-ray, and optical techniques to achieve best-in-class accuracy for advanced semiconductor nodes.
Role type
Senior IC metrology process development engineer
Builds
Advanced semiconductor patterning and scaling capabilities
Domain
Semiconductor manufacturing / Metrology
Deliverable
production ML models | product features | dashboards & analysis | research | client delivery | infrastructure | physical/clinical work
Required skills
CDSEM metrology, optical thin films, overlay/registration, X-ray metrology, AFM/wafer shape, semiconductor process flows (diffusion, CVD, Etch, Lithography), instrumentation calibration, data science, JMP
Preferred skills
Method innovation, workflow optimization, tool benchmarking, root-cause analysis, mentoring engineers
Technologies
CDSEM, AFM, X-ray, JMP
Responsibilities
Lead R&D and sustainment of advanced CDSEM metrology; Develop and standardize CD metrology methods; Drive inline detection strategies with process teams; Perform CD, profile, and roughness analysis; Partner with design and integration teams on metrology requirements; Generate high-impact metrology reports; Establish state-of-the-art CD metrology capabilities; Mentor and coach engineers; Influence supplier tool roadmaps
Seniority
Senior, hands-on IC