Masters Thesis student
Core
Investigate Dynamic Gate Switching (DGS) instability in SiC MOSFETs as a function of temperature through electrical characterization, reliability measurements, and modeling.
Role type
Masters Thesis student (Research & Development)
Builds
Test setup for DGS measurements, Vth drift models
Domain
Semiconductor physics / Power electronics / SiC MOSFETs
Required skills
Electrical characterization, Reliability investigation, Wafer-probing, Python programming, Microcontroller programming, SEM-cross section analysis
Preferred skills
Process integration knowledge, Bipolar mode switching analysis
Technologies
Keithley parameter analyzer, SEM, Python, Microcontrollers
