TEM Sample Prep Technician (Day Shift)
Core
Operate dual beam focused ion beam (FIB) tools to prepare high-quality samples for Transmission Electron Microscopy (TEM) analysis, including tool maintenance, calibration, and troubleshooting.
Role type
TEM Sample Prep Technician
Builds
High-quality TEM samples for advanced analysis
Domain
Semiconductor manufacturing / Failure analysis
Deliverable
physical/clinical work
Required skills
Dual beam FIB operation, Chemical and dry etch sample delayering, Physical failure analysis sample manipulation, Tool maintenance and calibration, SOP adherence, Microsoft Office proficiency
Preferred skills
2+ years of college or technical school, 1+ years of semiconductor field experience
Technologies
Dual beam FIB tools, Samsung software applications
Responsibilities
Operate Dual Beam FIB tools to prepare high quality samples free of damage or artifacts for TEM analysis, Perform level appropriate tool maintenance, calibration and troubleshooting, Strive for output and efficiency improvement to help the team achieve TAT and capa goals, Determine and assist in development of methods and procedures to optimize techniques and capabilities related to in-lab operations
Seniority
Entry-level to Mid-level, hands-on IC
