F16N Metrology Application Engineer
Core
Develop, analyze, and implement metrology measurement techniques (lithography overlay, CD-SEM, ellipsometry, scatterometry, XRF, surface profiling) to support semiconductor process evaluation, optimization, and characterization.
Role type
Metrology Application Engineer
Builds
Semiconductor manufacturing processes and equipment setups
Domain
Semiconductor manufacturing / Metrology
Deliverable
production ML models | product features | dashboards & analysis | research | client delivery | infrastructure | physical/clinical work
Required skills
Lithography overlay analysis, CD-SEM operation, Ellipsometry, Scatterometry, XRF, Surface profiling, Process optimization, NPI transfer support, Supplier tool CIP management, Quality metrics definition, Yield improvement, Cost reduction, Cycle time reduction, Technical standardization, AI tool integration
Preferred skills
Next-generation measurement capabilities, Evolutionary program coordination, Digital fluency, AI literacy
Technologies
CD-SEM, Ellipsometry, Scatterometry, XRF, SWR systems
Responsibilities
Develop and implement metrology measurement techniques for films; Perform SWR lots to assist engineers in evaluating new processes and equipment; Drive supplier tool CIP activity and NPI transfer; Engage in Fab operations to improve quality, reduce cost, and improve yield; Deliver reliable metrology applications and standardize team knowledge; Integrate AI-assisted tools to improve efficiency and effectiveness.
