F16 Metrology Application Engineer
Core
Develop, analyze, and implement metrology measurement techniques (lithography overlay, CD-SEM, ellipsometry, scatterometry, XRF, surface profiling) to support semiconductor manufacturing processes.
Role type
Metrology Application Engineer
Builds
Semiconductor memory and storage products (DRAM, NAND, NOR)
Domain
Semiconductor manufacturing / Metrology
Deliverable
production ML models | product features | dashboards & analysis | research | client delivery | infrastructure | physical/clinical work
Required skills
lithography overlay analysis, CD-SEM operation, ellipsometry, scatterometry, XRF, surface profiling, process optimization, NPI transfer, supplier tool CIP management, quality metrics definition, yield improvement, cost reduction, cycle time reduction, technical standardization, cross-functional collaboration with TD and MCT
Preferred skills
next-generation measurement capabilities, evolutionary program coordination
Technologies
CD-SEM, ellipsometry, scatterometry, XRF, lithography overlay tools
Responsibilities
Develop and implement metrology measurement techniques for films; Perform SWR lots to assist engineers with set-up metrology for new processes and equipment; Drive supplier tool CIP activity and assist in NPI transfer; Engage in Fab operations to improve quality, reduce cost, and improve yield; Deliver reliable metrology applications and standardize team knowledge.
Seniority
Individual Contributor, hands-on technical role