Process Engineer III, Secondary Ion Mass Spectrometry (SIMS) Metrology
Core
Design and optimize manufacturing processes for display and semiconductor technologies using Secondary Ion Mass Spectrometry (SIMS) metrology to characterize dopant profiles, film properties, and device architectures.
Role type
Senior IC Process Engineer (Metrology/SIMS)
Builds
Advanced SIMS characterization techniques, standard operating procedures, and statistical process control (SPC) for semiconductor and display fabrication.
Domain
Semiconductor manufacturing / Materials Science
Required skills
SIMS operation and maintenance, ion beam interaction with materials, data analysis and optimization, experimental design (DOE), root-cause analysis, statistical process control (SPC), tool-health monitoring, technical documentation, customer consultation and training.
Preferred skills
Semiconductor industry experience, vacuum electronics, atom probe tomography, mass spectrometry, failure analysis, ion doping metrology.
Technologies
SIMS, Vacuum Electronics, Atom Probe Tomography, Mass Spectrometry
Responsibilities
Characterize dopant profiles and diffusion depths; prioritize and manage SIMS lab activities; develop and refine standard operating procedures; drive advanced SIMS characterization techniques; build SPC and tool-health monitoring; provide consultation, training, and analytical support to customers.
Seniority
Senior, hands-on IC