Staff Defect Metrology AI/ML Engineer
Core
Lead technical development of AI/ML models and image-processing algorithms for semiconductor defect inspection, classification, and quantification to improve manufacturing yield and process control.
Role type
Staff IC machine-learning engineer (semiconductor metrology)
Builds
Automated defect detection and classification systems for wafer inspection
Domain
Semiconductor manufacturing / Metrology / AI/ML
Deliverable
production ML models
Required skills
Python, SQL, image processing, AI/ML, computer vision, statistical modeling, data analysis, DOE, SPC
Preferred skills
Wafer defect detection, automated data pipelines, optical wafer inspection systems (KLA Candela, Nanotronics), epitaxial growth knowledge, cleanroom protocols
Technologies
pandas, NumPy, scikit-learn, OpenCV, PyTorch, TensorFlow, JMP, Excel
Responsibilities
Develop image-processing algorithms and AI/ML models for defect detection; Analyze large datasets from wafer inspection and MOCVD processes; Integrate defect, process, and equipment data to identify yield drivers; Partner with process and equipment engineers to correlate defects with process changes; Improve inspection methodologies and statistical metrics; Ensure accuracy and integrity of metrology systems.
Seniority
Staff, hands-on IC with technical leadership