Materials Analyst, Microscopy
Core
Prepare high-quality, site-specific TEM lamella using Dual Beam FIB-SEM systems for advanced materials and semiconductor failure analysis.
Role type
Senior IC materials analyst (microscopy)
Builds
TEM samples for client failure analysis and characterization
Domain
Semiconductor and advanced materials
Deliverable
physical/clinical work
Required skills
TEM lamella preparation, Dual Beam FIB-SEM operation, SEM imaging, electron microscopy principles, semiconductor device physics, failure analysis concepts
Preferred skills
TEM lift-out techniques, high-throughput lab environment experience, technical communication
Technologies
Dual Beam FIB-SEM, SEM, TEM
Responsibilities
Prepare TEM lamella using Dual Beam FIB-SEM systems, perform SEM imaging for sample navigation and verification, manage client samples to meet quality standards and turnaround commitments, collaborate with internal teams to optimize workflows
Seniority
Mid-level, hands-on IC