Materials Scientist, Dual Beam Analysis
Core
Prepare high-quality TEM lamella, perform SEM imaging and EDS analysis on FIB cross-sections to support structural, compositional, and failure analysis for clients.
Role type
Senior IC materials scientist (dual beam microscopy)
Builds
Production analytical reports and failure analysis data for semiconductor and materials clients
Domain
Semiconductor device physics and materials characterization
Deliverable
production ML models | product features | dashboards & analysis | research | client delivery | infrastructure | physical/clinical work
Required skills
Dual Beam FIB/SEM operation, TEM sample preparation, SEM/EDX analysis, image processing of 2D/3D datasets, automation workflow development, semiconductor failure analysis knowledge
Preferred skills
Semiconductor chip product and wafer sample experience
Technologies
FIB/SEM systems, EDS, TEM
Responsibilities
Support FIB/SEM operation including lamella preparation and cross-sectioning, develop automation workflows for sample prep and imaging, maintain data acquisition pipelines, perform image analysis on FIB/SEM datasets, improve throughput and data quality, collaborate on failure analysis challenges, provide technical consultation to clients
Seniority
Senior, hands-on IC