Section Manager - YE/Defect Metrology (SM1)
Core
Lead factory-wide defect metrology strategies, drive yield improvement, and manage a team of engineers and technicians for defectivity reduction and excursion management in 300mm semiconductor manufacturing.
Role type
Senior IC manufacturing section manager (defect metrology)
Builds
Factory-wide defect control strategies, automated containment systems, and yield improvement roadmaps for advanced wafer fabrication
Domain
Semiconductor manufacturing (300mm wafer fabrication)
Deliverable
production ML models
Required skills
Defect metrology strategy, yield enhancement, excursion management, statistical process control (SPC), team leadership, root cause analysis, quality system compliance, AI-enabled manufacturing, cross-functional collaboration
Preferred skills
Managing teams of 8+, defectivity reduction in high-volume fab, 300mm multi-node experience, MTTD/MTTR framework development, advanced analytics tools, ISO/IATF audit compliance, multi-site benchmarking, executive presentation
Technologies
300mm wafer fabrication tools, SPC software, AI-enabled manufacturing platforms, automated containment systems
Responsibilities
Lead and develop a team of engineers and technicians for defect metrology; Define and execute factory-wide defect control strategies across production tools; Lead excursion detection, containment, and root cause resolution; Oversee Statistical Process Control (SPC) governance and quality systems; Partner with process engineering, integration, operations, equipment engineering, and quality teams; Champion AI-enabled manufacturing and data-driven decision-support initiatives
Seniority
Senior, hands-on IC with team leadership