Senior GaN Defect Metrology Engineer
Core
Drive defect metrology and yield improvement for GaN technology development in a 300mm wafer Fab.
Role type
Senior IC defect metrology engineer
Builds
Inspection strategies, new processes for advanced nodes, and defect resolution procedures for GaN devices
Domain
Semiconductor manufacturing, GaN technology, 300mm wafer fab
Deliverable
production ML models | product features | dashboards & analysis | research | client delivery | infrastructure | physical/clinical work
Required skills
statistical process control, engineering change control, process release strategies, defect metrology, process development, data analysis, problem resolution
Preferred skills
Python, AI models/tools, Brightfield/Darkfield inspection, SEM analysis, GaN integration knowledge, big data visualization
Technologies
Python, Claude, Brightfield, Darkfield, SEM
Responsibilities
Develop and implement inspection strategies to identify and resolve defects; Develop new processes from ground up for advanced node development; Perform lot and equipment dispositions to support continuous production flow; Provide training to junior colleagues and process technicians; Identify systematic problems in process or equipment sources and communicate findings; Support manufacturing ramp with equipment/process startup and process experiments; Collaborate across teams to solve fab priorities
Seniority
Senior, hands-on IC