Metrology OCD Library Team Section Manager #5665
Core
Develop and optimize OCD RCWA/ML library and film strategy models for inline/offline measurements during fab ramping and mass production, supporting N5/N4/N3 production issue analysis and process improvement.
Role type
Senior IC metrology engineer (library development & process integration)
Builds
Production-ready metrology libraries and measurement strategies for leading-edge semiconductor nodes
Domain
Semiconductor manufacturing (logic chips, 5nm and below)
Deliverable
production ML models
Required skills
Semiconductor manufacturing principles, OCD/Film spectrum analysis (3D/2D), KLA Acushape/OLSA, Onto NanoDiffract/WVASE, Nova Mars software modeling, library development, DoE wafer design, TEM optimization, root cause analysis, vendor coordination, team leadership
Preferred skills
6-sigma process control, chemical quality improvement, air/liquid purifier system expertise
Technologies
KLA Acushape, OLSA, Onto NanoDiffract, WVASE, Nova Mars
Responsibilities
Analyze OCD/Film spectrum for problem-solving and process improvement; establish spectrum RMSE comparison systems; examine process tool chamber matching results; coordinate with metrology vendors for library/recipe setup and system upgrades; train engineers in metrology measurement theory and library algorithms; collaborate with modules and integration teams to resolve measurement issues
Seniority
Senior, hands-on IC with management responsibilities