Metrology OCD Library Team Section Manager #5665
Core
Develop and optimize OCD RCWA/ML library and film strategy models for inline/offline measurements during Fab ramping and mass production, supporting N5/N4/N3 production issue analysis and process improvement.
Role type
Senior IC metrology engineer (library development & process integration)
Builds
Metrology OCD RCWA/ML libraries and film strategy models for semiconductor manufacturing
Domain
Semiconductor manufacturing (logic chips, 5nm and below)
Deliverable
production ML models
Required skills
Semiconductor manufacturing principles, OCD RCWA/ML library development, 5nm technology experience, KLA Acushape/OLSA/Onto Nova Mars software, DoE wafer design, TEM linearity optimization, vendor coordination, team leadership
Preferred skills
6-sigma process control, chemical quality improvement, air/liquid purifier system experience
Technologies
KLA Acushape, OLSA, Onto NanoDiffract/WVASE, Nova Mars
Responsibilities
Analyze OCD/Film spectrum in 3D/2D structures for problem-solving, establish spectrum RMSE comparison systems, examine process tool chamber matching results, coordinate with metrology vendors for library setup and system upgrades, train engineers in metrology measurement theory, collaborate with modules and integration teams to resolve measurement issues
Seniority
Senior, hands-on IC with team leadership